Publications of M. Balden

Poster (178)

621.
Poster
Balden, M.; Adelhelm, C.; De Juan Pardo, E.; Roth, J.: Chemical erosion by deuterium impact of carbon films doped with nanometer-sized carbide crystallites. 17th International Conference on Plasma Surface Interactions in Controlled Fusion Devices (PSI 17), Hefei Anhui (2006)
622.
Poster
Liang, J.; Mayer, M.; Jacob, W.; Roth, J.; Balden, M.; Eckstein, W.: Hydrogen isotopic effects on the chemical erosion of graphite induced by ion irradiation. 17th International Conference of Plasma Surface Interactions in Controlled Fusion Devices (PSI 17), Hefei Anhui (2006)
623.
Poster
Adelhelm, C.; Balden, M.: Investigations on the thermally induced structuring of metal-doped amorphous carbon films. HASYLAB Users Meeting, Hamburg (2006)
624.
Poster
Laux, M.; Schneider, W.; Juettner, B.; Balden, M.; Lindig, S.; Beilis, I.; Djakov, B.: Ignition and Burning of Vacuum Arcs on Tungsten Layers. 21st International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV), Yalta, Crimea Peninsula (2004)
625.
Poster
Cieciwa, B. T.; Balden, M.; Quintana, I.; de Juan Pardo, E.; Wiltner, A.; Sikora, M.; Bolt, H.: Metal-Doped Carbon Films Obtained by Magnetron Sputtering. 9th International Conference on Plasma Surface Engineering (PSE 2004), Garmisch-Partenkirchen (2004)
626.
Poster
Balden, M.; de Juan Pardo, E.; Quintana, I.; Cieciwa, B.; Roth, J.: Chemical Erosion by Deuterium Impact of Mixed Layers Containing Carbon. 16th International Conference on Plasma Surface Interactions in Controlled Fusion Devices (PSI 16), Portland, Maine (2004)
627.
Poster
Gao, L.; Gstöttner, J.; Emling, R.; Balden, M.; Linsmeier, C.; Wiltner, A.; Hansch, W.; Schmitt-Landsiedel, D.: Thermal stability of titanium nitride diffusion barrier films for advanced silver interconnects. Materials for Advanced Metallization (MAM 2004), Brussels (2004)
628.
Poster
Balden, M.; de Juan Pardo, E.; Maier, H.; Starke, P.; Fantz, U.: Chemical erosion behaviour of doped graphites under hydrogen impact - A comparison of ion beam experiments and planar inductively coupled RF plasmas. 10th International Workshop on Carbon Materials for Fusion Application, Jülich (2003)
629.
Poster
Herrmann, A.; Balden, M.; Bohmeyer, W.; Hildebrandt, D.: Investigation of IR emission from carbon microstructure on a 30 micron scale. 10th International Workshop on Carbon Materials for Fusion Application, Jülich (2003)
630.
Poster
Ordás, N.; Cemboráin, R.; Lindig, S.; Balden, M.; Wang, H.; García-Rosales, C.: Effect of catalytic graphitization on the thermo-mechanical properties of isotropic graphite doped with metallic carbides. 10th International Workshop on Carbon Materials for Fusion Application, Jülich (2003)

Teaching (20)

631.
Teaching
Stroth, U.; Balden, M.; Castillo Castillo, A.; Dörsch, G.: Einführung in die Rasterelektronenmikroskopie. Lecture: Praktikum (SS 2023), Technische Universität München, May 02, 2023 - July 15, 2023
632.
Teaching
Stroth, U.; Balden, M.; Dörsch, G.; Kärcher, A.: Einführung in die Rasterelektronenmikroskopie. Lecture: Praktikum (WS 2022/2023) (Fortgeschrittene), Technische Universität München, October 31, 2022 - February 04, 2023
633.
Teaching
Stroth, U.; Balden, M.; Dörsch, G.; Kremer, K. J.: Einführung in die Rasterelektronenmikroskopie. Lecture: Praktikum (SS 2022), Technische Universität München
634.
Teaching
Stroth, U.; Balden, M.; Dörsch, G.; Kärcher, A.: Einführung in die Rasterelektronenmikroskopie. Lecture: Praktikum (SS 2021), Technische Universität München
635.
Teaching
Stroth, U.; Balden, M.; Dörsch, G.; Kremer, K.: Einführung in die Rasterelektronenmikroskopie. Lecture: Praktikum (WS 2020/2021), Technische Universität München
636.
Teaching
Stroth, U.; Balden, M.; Dörsch, G.; Kremer, K.: Einführung in die Rasterelektronenmikroskopie. Lecture: Praktikum (WS 2019/2020), Technische Universität München
637.
Teaching
Stroth, U.; Balden, M.; Dörsch, G.: Einführung in die Rasterelektronenmikroskopie. Lecture: Praktikum (WS 2018/2019), Technische Universität München
638.
Teaching
Stroth, U.; Balden, M.; Dörsch, G.: Einführung in die Rasterelektronenmikroskopie. Lecture: Praktikum (WS 2017/2018), Technische Universität München
639.
Teaching
Balden, M.: Charakterisierung mittels Rasterelektronenmikroskopie (SEM) und fokusiertem Ionenstahl (FIB). Lecture: Vorlesung Oberflächentechnik (SS 2009), Technische Universität München
640.
Teaching
Bolt, H.; Balden, M.; Koch, F.; Jacob, W.: Oberflächentechnik. Lecture: Vorlesung (SS 2009), Technische Universität München
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